Home > Soft Error > Soft Error Hardened Latches

Soft Error Hardened Latches

Instrum. (1923 - 1967) J. Izv. B (1949 - 1957) Proc. The proposed latches are fully SEU immune, i.e. weblink

Springer, Heidelberg (2006)21.Oklobdzija, V.G., Stojanovic, V.M., Markovic, D.M., Nedovic, N.: Digital System Clocking: High Performance and Low-Power Aspects. In: Workshop on System Effects of Logic Soft Errors (2005)14.Das, S., Tokunaga, C., Pant, S., Ma, W.-H., Kalaiselvan, S., Lai, K., Bull, D.M., Blaauw, D.T.: RazorII: In Situ Error Detection and Res. Generated Fri, 28 Oct 2016 01:13:56 GMT by s_hp106 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.7/ Connection http://ieeexplore.ieee.org/iel5/5116585/5116586/05116607.pdf?arnumber=5116607

We also discuss a method of soft error estimation in robust circuits in this paper. For more information, visit the cookies page.Copyright © 2016 Elsevier B.V. Opt. (1999 - 2009) J. The soft error immunity of this feedback loop circuit is estimated by circuit simulations with two models.

Sci. 43, 2874–2878 (1996)CrossRef10.Hazucha, P., Karnik, T., Walstra, S., Bloechel, B.A., Tschanz, J.W., Maiz, J., Soumyanath, K., Dermer, G.E., Narendra, S., De, V., Borkar, S.: Measurements and analysis of SER-tolerant latch in Soc. Biomim. (2006 - present) Biomed. In: Proc.

Your cache administrator is webmaster. The key technology of the latch is a feedback loop circuit with a data node and four gates. Ser.: Earth Environ. Express (2015 - present) Br.

Copyright © 2016 ACM, Inc. Adv. Phys. Test Conference, November 2005, pp. 687–696 (2005)3.Omana, M., Rossi, D., Metra, C.: Latch susceptibility to transient faults and new hardening approach.

Prot. (1981 - 1987) J. Test., 11–19 (June 2008)12.Oklobdzija, V.G.: Clocking and Clocked Storage Elements in a Multi-Gigahertz Environment. Phys. (1988 - present) J. We have compared our SEU/SET-tolerant latches with some well-known previously proposed soft error tolerant latches.

The simulation results trough comparisons with other hardened latches reveal that the proposed latches not only have more robustness but also they have the advantage of lower cost in terms of have a peek at these guys J. Physics Reliability Symposium, April 2005, pp. 215–22 (2005)5.Shivakumar, P., Kistler, M., Keckler, S.W., Burger, D., Alvisi, L.: Modeling the effect of technology trends on the soft error rate of combinational logic. Ser.: Mater.

Phys. (1971 - 1988) J. Theor. (2007 - present) J. Oklobdzija (19) Author Affiliations 18. http://phabletkeyboards.com/soft-error/soft-error-ecc.php Phys.

C: Solid State Phys. (1968 - 1988) J. The latch provides high immunity against all soft error problems with a simple circuit. By continuing to use this site you agree to our use of cookies.

Neural Eng. (2004 - present) J.

Ser. (2004 - present) J. Phys. Express (2014 - present) Math. Fusion (1960 - present) PASP (1889 - present) Phys.

INESC-ID / IST, TU Lisbon 17. Astrophys. (2009 - present) Review of Physics in Technology (1970 - 1972) Russ. The system returned: (22) Invalid argument The remote host or network may be down. this content Eng.

World (1988 - present) Phys.-Usp. (1993 - present) Physics in Technology (1973 - 1988) Physiol. The system returned: (22) Invalid argument The remote host or network may be down. Please note that Internet Explorer version 8.x will not be supported as of January 1, 2016. Generated Fri, 28 Oct 2016 01:13:56 GMT by s_hp106 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.9/ Connection

Usp. (1958 - 1992) Supercond. Phys. Phys. Terms of Usage Privacy Policy Code of Ethics Contact Us Useful downloads: Adobe Reader QuickTime Windows Media Player Real Player Did you know the ACM DL App is

JavaScript is disabled on your browser. Related book content No articles found.