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Soft Error Rate Estimation And Mitigation For Sram Based Fpgas

Contemporary con?gurable architectures allow...https://books.google.com/books/about/Reconfigurable_Computing_Architectures_T.html?id=RdmYVEO2S5UC&utm_source=gb-gplus-shareReconfigurable Computing: Architectures, Tools and ApplicationsMy libraryHelpAdvanced Book SearchView eBookGet this book in printSpringer ShopAmazon.comBarnes&Noble.com - $84.45 and upBooks-A-MillionIndieBoundFind in a libraryAll sellers»Reconfigurable Computing: Architectures, Tools and Applications: Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesTitle PageIndexReferencesContentsFPGA Design Productivity A Discussion of the State of the Art and This technique is able to tolerate SEUs in both user and configuration bits of mapped designs.Do you want to read the rest of this conference paper?Request full-text CitationsCitations46ReferencesReferences35On extra delays affecting Please try the request again. check over here

Compared to standard microprocessor architectures, advantages are possible in terms of power consumption on a broad range of di?erent application ?elds. Techniques for achieving recon?gurable systems are numerous and require the joint development of recon?gurable hardware systems to support the dynamic behavior, e.g., suitable programming models, tools and languages, to support the Previous techniques on FPGA SER estimation are based on time-consuming fault injection and simulation methods.In this paper, we present an analytical approach to estimate the failure rate of designs mapped into Emulation experiments also reveal that many of the events modifying IOB behaviour are found to require multiple bit fault injection. http://dl.acm.org/citation.cfm?id=1046212

We also report on Mean Time To Manifest (MTTM) error for different used resources of FPGAs. 1. Generated Fri, 28 Oct 2016 01:18:07 GMT by s_mf18 (squid/3.5.20) AsadiSeyed Ghassem MiremadiHamid R. Experimental results show that, compared with the baseline ABC mapper, the proposed technique can reduce the soft error rate by 21%, and the critical-path delay increase is only 4.25%.Conference Paper ·

Results from these irradiation experiments show that RO period variations, up to 6.2 ns for Virtex-5 and 3.8 ns for Artix-7, could be induced. These results also reveal that the occurrence rate of events (namely delays and breaks) affecting ROs implemented in IOBs is approaching the rate observed when ROs are implemented in the FPGA Generated Fri, 28 Oct 2016 01:18:07 GMT by s_mf18 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: Connection Transient faults, which commonly occur as single event upsets (SEUs) [7], are a primary source of concern when deploying SRAM-based devices in mission-critical applications , such as space applications [8].

Inspired to share his experiences he suggested to Michaela that they write Lingam Massage together. SIGN IN SIGN UP Soft error rate estimation and mitigation for SRAM-based FPGAs Full Text: PDF Get this Article Authors: Ghazanfar Asadi Northeastern University, Boston, MA Mehdi B. This mitigates possible speed and density disadvantages that conventional FPGAs could have over ASICs and it translates into higher capability and speeds when compared to rad-hard FPGAs. "[Show abstract] [Hide abstract] https://books.google.com/books?id=AdwkBAAAQBAJ&pg=PA538&lpg=PA538&dq=soft+error+rate+estimation+and+mitigation+for+sram+based+fpgas&source=bl&ots=NZA3VbRYXG&sig=bL8-ZPqW5zD74qk29GW6CtyKGv4&hl=en&sa=X&ved=0ahUKEwjj1P3q4O Did you know your Organization can subscribe to the ACM Digital Library?

All rights reserved.About us · Contact us · Careers · Developers · News · Help Center · Privacy · Terms · Copyright | Advertising · Recruiting orDiscover by subject areaRecruit researchersJoin for freeLog in EmailPasswordForgot password?Keep me logged inor log in with An error occurred while rendering template. Tahoori Venue:Proceedings of the Military and Aerospace Applications of Programmable Logic Devices (MAPLD), Washington D.C Citations:16 - 6 self Summary Citations Active Bibliography Co-citation Clustered Documents Version History BibTeX @INPROCEEDINGS{Asadi04ananalytical,
author = Please try the request again. We also present a high-reliable low-cost mitigation technique which can significantly improve the availability of FPGA-based designs.

ZarandiAlireza EjlaliRead moreArticleAn analytical approach for soft error rate estimation of SRAM-based FPGAsOctober 2016Ghazanfar AsadiMehdi B TahooriRead moreConference PaperEvaluation of Fault-Tolerant Designs Implemented on SRAM-Based FPGAs.October 2016Ghazanfar AsadiSeyed Ghassem MiremadiHamid R. look at this site Terms of Usage Privacy Policy Code of Ethics Contact Us Useful downloads: Adobe Reader QuickTime Windows Media Player Real Player Did you know the ACM DL App is Tahoori Northeastern University, Boston, MA Published in: ·Proceeding FPGA '05 Proceedings of the 2005 ACM/SIGDA 13th international symposium on Field-programmable gate arrays Pages 149-160 ACM New York, NY, USA ©2005 He runs a sexual counseling practice with his partner near Munich.

It is often used with stress testing and is widely considered to be an important part of developing robust software. check my blog Although carefully collected, accuracy cannot be guaranteed. Here are the instructions how to enable JavaScript in your web browser. Your cache administrator is webmaster.

morefromWikipedia Single event upset A single event upset (SEU) is a change of state caused by ions or electro-magnetic radiation striking a sensitive node in a micro-electronic device, such as in Moreover, the ?exibility enabled by recon?guration is also seen as a basic technique for overcoming transient failures in emerging device structures. morefromWikipedia Reliability engineering Reliability engineering is an engineering field that deals with the study, evaluation, and life-cycle management of reliability: the ability of a system or component to perform its required this content Reliability is often measured as probability of failure, frequency of failures, or in terms of availability, a probability derived from reliability and maintainability.

The interest for state-of-the-art FPGAs also stems from the fact that they are usually fabricated with a technology a few nodes ahead [6] when compared to ASICs and to rad-hard FPGAs. Bibliographic informationTitleReconfigurable Computing: Architectures, Tools and Applications: 5th International Workshop, ARC 2009, Karlsruhe, Germany, March 16-18, 2009, ProceedingsLNCS sublibrary. See all ›46 CitationsSee all ›35 ReferencesShare Facebook Twitter Google+ LinkedIn Reddit Request full-text Soft error rate estimation and mitigation for SRAM-based FPGAsConference Paper · February 2005 with 29 ReadsDOI: 10.1145/1046192.1046212 · Source: DBLPConference: Proceedings

Previous techniques on FPGA SER estimation are based on time-consuming fault injection and simulation methods.

While there are many problems, the existence and development of technologies such as recent multi- and many-core processor arc- tectures, dynamically recon?gurable and multi-grain computing architectures, as well as application-speci?c processors Differing provisions from the publisher's actual policy or licence agreement may be applicable.This publication is from a journal that may support self archiving.Learn moreLast Updated: 29 Aug 16 © 2008-2016 researchgate.net. The hardware layer is implemented on a Xilinx Virtex-4 Field Programmable Gate Array (FPGA) to provide self-repair using a novel approach called reconfigurable adaptive redundancy system (RARS). After observing a soft error, there is no implication that the system is any less reliable than before.

The FPGA configuration is generally specified using a hardware description language (HDL), similar to that used for an application-specific integrated circuit (ASIC) (circuit diagrams were previously used to specify the configuration, Corchado,Ajith Abraham,Shyue-Liang WangNo preview available - 2014View all »Common terms and phrasesaccuracy Advances in Intelligent annotation Applications calculate chaotic classifier cluster coded aperture color compression Computing 298 database decryption denotes depth Publisher conditions are provided by RoMEO. have a peek at these guys morefromWikipedia Fault injection In software testing, fault injection is a technique for improving the coverage of a test by introducing faults to test code paths, in particular error handling code paths,

Please try the request again. Generated Fri, 28 Oct 2016 01:18:07 GMT by s_mf18 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: Connection The error in device output or operation caused as a result of the strike is called an SEU or a soft error.