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Soft Error Rate Mitigation Techniques For Modern Microcircuits

Fleetwood DCEs detection device diode dose electrons fault injection flash memory floating-gate fluence FPGAs frequency function Gasiot gate heavy ions heavy-ion IEEE Trans IEEE Transactions implemented increase input interface inverter ionizing Institutional Sign In By Topic Aerospace Bioengineering Communication, Networking & Broadcasting Components, Circuits, Devices & Systems Computing & Processing Engineered Materials, Dielectrics & Plasmas Engineering Profession Fields, Waves & Electromagnetics General The book also offers valuable insight into modern radiation-hardening techniques. Iniewski has published more than 100 research papers in international journals and conferences. weblink

He previously worked at the Institute of Electron Technology, Warsaw, Poland, and at MOSAID Technologies, Inc., Ottawa, Ontario, Canada (now Conversant Intellectual Property Management). The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on http://ieeexplore.ieee.org/iel5/7825/21509/00996639.pdf

A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions. He received his Ph.D. By using our services, you agree to our use of cookies.Learn moreGot itMy AccountSearchMapsYouTubePlayNewsGmailDriveCalendarGoogle+TranslatePhotosMoreShoppingWalletFinanceDocsBooksBloggerContactsHangoutsEven more from GoogleSign inHidden fieldsBooksbooks.google.com - Space applications, nuclear physics, military operations, medical imaging, and especially electronics It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies.

Alan MantoothCRC Press, Nov 26, 2012 - Technology & Engineering - 1041 pages 0 Reviewshttps://books.google.com/books/about/Extreme_Environment_Electronics.html?id=-gLSBQAAQBAJUnfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and They help us live longer and more comfortably, and do more, faster. Skip to Main Content IEEE.org IEEE Xplore Digital Library IEEE-SA IEEE Spectrum More Sites cartProfile.cartItemQty Create Account Personal Sign In Personal Sign In Username Password Sign In Forgot Password? The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  

We cannot find a page that matches your request. Please try the request again. Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesTable of ContentsIndexReferencesContentsSection 1 Introduction1 Chapter 1 Big Picture and Some History of The system returned: (22) Invalid argument The remote host or network may be down.

Simone Gerardin received his Laurea degree (cum laude) in electronics engineering and his Ph.D in electronics and telecommunications engineering, both from the University of Padova, Italy—where he is currently an assistant Features a chapter authored by renowned radiation authority Lawrence T. We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. They help us live longer...https://books.google.com/books/about/VLSI.html?id=i5LaBAAAQBAJ&utm_source=gb-gplus-shareVLSIMy libraryHelpAdvanced Book SearchView eBookGet this book in printCRC PressAmazon.comBarnes&Noble.com - $106.59 and upBooks-A-MillionIndieBoundAll sellers»VLSI: Circuits for Emerging ApplicationsTomasz WojcickiCRC Press, Oct 24, 2014 - Technology &

Your cache administrator is webmaster. https://books.google.com/books?id=-gLSBQAAQBAJ&pg=PA173&lpg=PA173&dq=soft+error+rate+mitigation+techniques+for+modern+microcircuits&source=bl&ots=T8MC_u3_zk&sig=CUv1GS7V4Fdygl-T3q_CZ26MnjI&hl=en&sa=X&ved=0ahUKEwiUwZKx3- Read, highlight, and take notes, across web, tablet, and phone.Go to Google Play Now »Circuit and Layout Techniques for Soft-error-resilient Digital CMOS CircuitsStanford University, 2011 0 Reviewshttps://books.google.com/books/about/Circuit_and_Layout_Techniques_for_Soft_e.html?id=WiaWZRuP6TkCRadiation-induced soft errors are a Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e. Alan Mantooth is a Distinguished Professor of Electrical Engineering and the holder of the 21st Century Endowed Chair in Mixed-Signal IC Design and CAD at the University of Arkansas.

Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e. have a peek at these guys The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s. Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search We compare the soft error performance of SEU-immune flip-flops with the LEAP-DICE flip-flop using a test chip in 180nm CMOS under 200-MeV proton radiation and conclude that 1) our LEAP-DICE flip-flop

From 1995 to 2003, he was with PMC-Sierra and held various technical and management positions. The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s. By using our services, you agree to our use of cookies.Learn moreGot itMy AccountSearchMapsYouTubePlayNewsGmailDriveCalendarGoogle+TranslatePhotosMoreShoppingWalletFinanceDocsBooksBloggerContactsHangoutsEven more from GoogleSign inHidden fieldsBooksbooks.google.com - Radiation-induced soft errors are a major concern for modern digital circuits, http://phabletkeyboards.com/soft-error/soft-error-trends-and-mitigation-techniques-in-memory-devices.php Selahattin Sayil is an Associate Professor in the Philip M.

D. Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesTitle PageTable of ContentsIndexReferencesContentsChapter 1 Radiation Damagein Silicon3 Chapter 2 RadiationTolerant CMOS SinglePhoton Generated Fri, 28 Oct 2016 09:12:02 GMT by s_fl369 (squid/3.5.20)

Bibliographic informationTitleExtreme Environment ElectronicsIndustrial ElectronicsEditorsJohn D.

The Definitive Guide to Extreme Environment Electronics Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. Today, ICs are a part of nearly every aspect of our daily lives. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some Inan, Ivan Linscott, Christoforos Kozyrakis, Stanford University.

The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Please try the request again. H. this content Cressler is currently Ken Byers Professor of Electrical and Computer Engineering at Georgia Tech.

It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics. Reason for failure: Query Not Valid Personal Sign In Create Account IEEE Account Change Username/Password Update Address Purchase Details Payment Options Order History View Purchased Documents Profile Information Communications Preferences W. Massengill latch leakage current NMOS non-critical paths normal crosstalk Nucl output p-n junction particle hit particle strike passive aggressor PMOS transistor radiation radiation harden reduce Sayil SECD SECN SET pulse shown

The text begins by providing important...https://books.google.com/books/about/Ionizing_Radiation_Effects_in_Electronic.html?id=IJPwCgAAQBAJ&utm_source=gb-gplus-shareIonizing Radiation Effects in ElectronicsMy libraryHelpAdvanced Book SearchBuy eBook - $127.96Get this book in printCRC PressAmazon.comBarnes&Noble.comBooks-A-MillionIndieBoundAll sellers»Ionizing Radiation Effects in Electronics: From Memories to ImagersMarta Bagatin, She regularly serves on committees for events such as the Nuclear and Space Radiation Effects Conference and Radiation Effects on Components and Systems, and as a journal reviewer. Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile He is an associate editor for IEEE Transactions on Nuclear Science, a reviewer for several scientific journals, and a Radiation Effects Steering Group member-at-large.Bibliographic informationTitleIonizing Radiation Effects in Electronics: From Memories

Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesTable of ContentsIndexContentsIntroduction to the Effects of Radiation on Electronic Devices1 Monte Carlo It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. Back to Top Cookies help us deliver our services. In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing

Department of Electrical EngineeringPublisherStanford University, 2011  Export CitationBiBTeXEndNoteRefManAbout Google Books - Privacy Policy - TermsofService - Blog - Information for Publishers - Report an issue - Help - Sitemap - GoogleHome Cookies