Our experiments on the ISCAS'85 benchmarks and a few other circuits indicate that, this conditional probability is quite significant and can be as high as 0.31. The proposed model can be effectively used for the estimation of the mean time to the failure with different design parameters during the early design states.Article · Apr 2013 Soonyoung LeeSang SchefferCRC Press, Apr 27, 2016 - Technology & Engineering - 786 pages 0 Reviewshttps://books.google.com/books/about/Electronic_Design_Automation_for_IC_Impl.html?id=B-obDAAAQBAJThe second of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design See all ›5 CitationsSee all ›19 ReferencesShare Facebook Twitter Google+ LinkedIn Reddit Read full-text Soft error trends and mitigation techniques in memory devicesConference Paper (PDF Available) · February 2011 with 28 ReadsDOI: 10.1109/RAMS.2011.5754515 · Source: weblink
He is a senior member of the Institute of Electrical and Electronics Engineers.Louis K. He worked at Hewlett Packard from 1975 to 1981 as a chip designer and computer-aided design tool developer. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE)
His research interests include the synthesis of asynchronous low-power circuits, the concurrent design of mixed hardware and software embedded systems, the high-level synthesis of digital circuits, the design and optimization of He rejoined Cadence in 2013 when it acquired Tensilica, and has been there since, working in the Tensilica part of the Cadence Intellectual Property Group. This likelihood has been studied to a great extent in memories, but has not been understood to the same extent in logic circuits. Therefore, the probability that an energetic particle can generate enough charge to upset a circuit is increasing.
Comments FAQ Share Email page to: Print this page Save this page Average Rating Out of 0 Ratings Rate this item View comments Add comments Comments FAQ ASQ News Contact At the architectural level, soft errors are commonly modeled by a probabilistic bit-flip model. He received his bachelor’s and master’s degrees in mathematics (combinatorics and optimization) from the University of Waterloo, Ontario, Canada, in 1977 and 1978. http://asq.org/ec/2011/04/quality-assurance/soft-error-trends-and-mitigation-techniques-in-memory-devices.html?shl=104023 As a consequence, the classical detection/correction schemes are becoming ineffective.
Generated Fri, 28 Oct 2016 01:02:09 GMT by s_wx1196 (squid/3.5.20) Markov, Grant Martin, Louis K. RaoShahbaz SarikMadhav P. Martin is a distinguished engineer at Cadence Design Systems, Inc., San Jose, California, USA.
Since 2011, he has been a full professor with Politecnico di Torino. have a peek at these guys Between 1993 and 2000, he was the architect of the POLIS project, a cooperation between UC Berkeley, Cadence Design Systems, Magneti Marelli, and Politecnico di Torino, which developed a complete hardware/software Skip to MainContent IEEE.org IEEE Xplore Digital Library IEEE-SA IEEE Spectrum More Sites cartProfile.cartItemQty Create Account Personal Sign In Personal Sign In Username Password Sign In Forgot Password? Generated Fri, 28 Oct 2016 01:02:09 GMT by s_wx1196 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.10/ Connection
During the 2011 redesign of the ACM Computing Classification System, Professor Markov led the effort on the hardware tree. In 2008, Dr. He has been the technical program chair of the Design Automation Conference, and the technical program committee and general chair of the International Conference on Hardware/Software Codesign and System Synthesis. check over here Since these single event upsets do not damage the IC, they are called soft errors.
As electronic design automation (EDA) is no longer his daily staple (though his research uses a number of algorithms derived from EDA), he is extremely grateful to Igor Markov for taking The system returned: (22) Invalid argument The remote host or network may be down. The Berger codes are used in DRAMs to detect unidirectional errors, but produce a considerable delay when considering large memory sizes.
Generated Fri, 28 Oct 2016 01:02:09 GMT by s_wx1196 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.8/ Connection Your cache administrator is webmaster. Your cache administrator is webmaster. Richard Newton Breakthrough Research Award, and IEEE Council on Electronic Design Automation Early Career Award.
The families of codes proposed are based on the Berger code and can be used to detect, localize and correct single or multi-bit errors at the expense of more check bits Please try the request again. Full-text · Oct 2012Read now Division Home Quality Information Announcements Newsletters Journals Library Resources Courses & Certification Calendar and Events Interaction Discussion Board Conferences Submit Content Get Involved About the http://phabletkeyboards.com/soft-error/soft-error-rate-trends.php The NAB in structure of multiple memory blocks is one of the most important parameter in determining the reliability of the memory.
In 1991, Valid merged with Cadence Design Systems, after which Dr. The system returned: (22) Invalid argument The remote host or network may be down. Also, there is no correction feature for either soft or hard errors. Professor Markov is a recipient of the Design Automation Conference Fellowship, ACM Special Interest Group on Design Automation Outstanding New Faculty Award, National Science Foundation Faculty Early Career Development Program Award,
Between 2003 and 2014, he was one of the creators and architects of the Cadence C-to-Silicon high-level synthesis system. He is currently affiliated with the Howard Hughes Medical Institute, Ashburn, Virginia, USA. Access this Content You will need Adobe Reader to view this PDF document. As CMOS process technology scales below 100nm, the amount of charge required to upset a gate or memory cell (Qcrit) is decreasing.
However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component He researches computers that make computers, including algorithms and optimization techniques for electronic design automation, secure hardware, and emerging technologies. Lou is also interested in the Search for Extraterrestrial Intelligence (SETI), serves on the technical advisory board for the Allen Telescope Array at the SETI Institute, and has coauthored the book Institutional Sign In By Topic Aerospace Bioengineering Communication, Networking & Broadcasting Components, Circuits, Devices & Systems Computing & Processing Engineered Materials, Dielectrics & Plasmas Engineering Profession Fields, Waves & Electromagnetics General
Download the free Reader from Adobe You must log in to comment. Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesTitle PageTable of ContentsIndexReferencesContentsAnalog and MixedSignal Design415 Physical Verification501 Technology ComputerAided Design689 Back